CY62147EV30 MoBL®
4-Mbit (256K x 16) Static RAM
ideal for providing More Battery Life™ (MoBL®) in portable appli-
cations such as cellular telephones. The device also has an
automatic power down feature that significantly reduces power
consumption when addresses are not toggling. Placing the
device into standby mode reduces power consumption by more
than 99% when deselected (CE HIGH or both BLE and BHE are
HIGH). The input and output pins (IO0 through IO15) are placed
in a high impedance state when:
Features
■
Very high speed: 45 ns
■
Temperature ranges
❐
❐
❐
Industrial: –40°C to +85°C
Automotive-A: –40°C to +85°C
Automotive-E: –40°C to +125°C
■
■
■
Wide voltage range: 2.20V to 3.60V
Pin compatible with CY62147DV30
Ultra low standby power
■
■
■
Deselected (CE HIGH)
Outputs are disabled (OE HIGH)
Both Byte High Enable and Byte Low Enable are disabled
(BHE, BLE HIGH)
❐
Typical standby current: 1 μA
❐
Maximum standby current: 7 μA (Industrial)
■
Write operation is active (CE LOW and WE LOW)
■
Ultra low active power
Typical active current: 2 mA at f = 1 MHz
Automatic power down when deselected
CMOS for optimum speed and power
To write to the device, take Chip Enable (CE) and Write Enable
(WE) inputs LOW. If Byte Low Enable (BLE) is LOW, then data
from IO pins (IO0 through IO7) is written into the location
specified on the address pins (A0 through A17). If Byte High
❐
■
■
■
■
Enable (BHE) is LOW, then data from IO pins (IO8 through IO15
)
is written into the location specified on the address pins (A0
through A17).
AvailableinPb-free48-ballVFBGA(single/dualCEoption)and
44-pin TSOPII packages
To read from the device, take Chip Enable (CE) and Output
Enable (OE) LOW while forcing the Write Enable (WE) HIGH. If
Byte Low Enable (BLE) is LOW, then data from the memory
location specified by the address pins appear on IO0 to IO7. If
Byte High Enable (BHE) is LOW, then data from memory
complete description of read and write modes.
■
Byte power down feature
Functional Description
The CY62147EV30 is a high performance CMOS static RAM
organized as 256K words by 16 bits. This device features
advanced circuit design to provide ultra low active current. It is
For best practice recommendations, refer to the Cypress
Logic Block Diagram
DATA IN DRIVERS
A
10
9
A
A
8
A
7
6
5
4
3
A
A
A
256K x 16
IO –IO
0
7
RAM Array
A
IO –IO
8
15
A
2
1
0
A
A
COLUMN DECODER
BHE
WE
CE
POWER DOWN
CIRCUIT
BHE
BLE
[1]
CE
OE
BLE
Note
1. BGA packaged device is offered in single CE and dual CE options. In this data sheet, for a dual CE device, CE refers to the internal logical combination of CE and
1
CE such that when CE is LOW and CE is HIGH, CE is LOW. For all other cases CE is HIGH.
2
1
2
Cypress Semiconductor Corporation
Document #: 38-05440 Rev. *G
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised March 31, 2009
CY62147EV30 MoBL®
Output Current into Outputs (LOW) ............................ 20 mA
Maximum Ratings
Exceeding the maximum ratings may impair the useful life of the
device. User guidelines are not tested.
Static Discharge Voltage .......................................... >2001V
(MIL-STD-883, Method 3015)
Storage Temperature ................................ –65°C to + 150°C
Latch Up Current .....................................................>200 mA
Ambient Temperature with
Power Applied .......................................... –55°C to + 125°C
Operating Range
Supply Voltage to Ground
Potential .............................–0.3V to + 3.9V (VCCmax + 0.3V)
Ambient
[7]
Device
Range
VCC
Temperature
CY62147EV30LL Ind’l/Auto-A –40°C to +85°C
2.2V to
3.6V
Auto-E
–40°C to +125°C
Electrical Characteristics
Over the Operating Range
45 ns (Ind’l/Auto-A)
55 ns (Auto-E)
Parameter
Description
Test Conditions
IOH = –0.1 mA
Unit
Min
2.0
2.4
Max
Min
Max
VOH
Output HIGH
Voltage
2.0
2.4
V
V
IOH = –1.0 mA, VCC > 2.70V
IOL = 0.1 mA
VOL
VIH
VIL
Output LOW
Voltage
0.4
0.4
0.4
0.4
V
I
OL = 2.1 mA, VCC = 2.70V
VCC = 2.2V to 2.7V
CC= 2.7V to 3.6V
V
Input HIGH
Voltage
1.8
2.2
VCC + 0.3 1.8
VCC + 0.3 2.2
VCC + 0.3
VCC + 0.3
0.6
V
V
V
Input LOW
Voltage
VCC = 2.2V to 2.7V
VCC= 2.7V to 3.6V
GND < VI < VCC
–0.3
–0.3
–1
0.6
0.8
+1
–0.3
–0.3
–4
V
0.8
V
IIX
Input Leakage
Current
+4
μA
IOZ
ICC
Output Leakage GND < VO < VCC, Output Disabled
Current
–1
+1
–4
+4
μA
VCC Operating
Supply Current
f = fmax = 1/tRC VCC = VCC(max)
15
2
20
15
2
25
3
mA
IOUT = 0 mA
f = 1 MHz
2.5
CMOS levels
ISB1
Automatic CE
Power Down
Current —
CE > VCC – 0.2V
1
7
1
20
μA
μA
VIN > VCC – 0.2V, VIN < 0.2V
f = fmax (Address and Data Only),
f = 0 (OE, BHE, BLE and WE),
VCC = 3.60V
CMOS Inputs
[8]
ISB2
Automatic CE
Power Down
Current —
1
7
1
20
CE > VCC – 0.2V
V
IN > VCC – 0.2V or VIN < 0.2V,
f = 0, VCC = 3.60V
CMOS Inputs
Capacitance
Parameter
Description
Input Capacitance
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
CC = VCC(typ)
Max
Unit
CIN
10
10
pF
pF
V
COUT
Notes
5.
6.
V
= –2.0V for pulse durations less than 20 ns.
IL(min)
V
= V + 0.75V for pulse durations less than 20 ns.
IH(max)
CC
7. Full device AC operation assumes a minimum of 100 μs ramp time from 0 to V (min) and 200 μs wait time after V stabilization.
CC
CC
8. Only chip enable (CE) and byte enables (BHE and BLE) need to be tied to CMOS levels to meet the I
/ I
spec. Other inputs can be left floating.
SB2 CCDR
9. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05440 Rev. *G
Page 3 of 13
CY62147EV30 MoBL®
VFBGA
Package
TSOP II
Package
Parameter
Description
Test Conditions
Unit
ΘJA
Thermal Resistance
(Junction to Ambient)
Still Air, soldered on a 3 × 4.5 inch, two-layer
printed circuit board
75
77
13
°C/W
ΘJC
Thermal Resistance
(Junction to Case)
10
°C/W
Figure 4. AC Test Load and Waveforms
R1
ALL INPUT PULSES
VCC
OUTPUT
VCC
90%
90%
10%
10%
GND
Rise Time = 1 V/ns
R2
30 pF
Fall Time = 1 V/ns
INCLUDING
JIG AND
SCOPE
Equivalent to: THEVENIN EQUIVALENT
RTH
OUTPUT
V
Parameters
2.50V
16667
15385
8000
3.0V
1103
1554
645
Unit
Ω
R1
R2
Ω
RTH
VTH
Ω
1.20
1.75
V
Data Retention Characteristics
Over the Operating Range
Parameter
Description
VCC for Data Retention
Data Retention Current
Conditions
VDR
1.5
V
[8]
ICCDR
VCC= 1.5V, CE > VCC – 0.2V,
IN > VCC – 0.2V or VIN < 0.2V
Ind’l/Auto-A
Auto-E
0.8
7
μA
V
12
[9]
tCDR
Chip Deselect to Data Retention Time
Operation Recovery Time
0
ns
ns
[10]
tR
tRC
DATA RETENTION MODE
VCC(min)
VCC(min)
V
DR
> 1.5V
VCC
t
t
R
CDR
CE or
BHE.BLE
Notes
10. Full device operation requires linear V ramp from V to V
11. BHE.BLE is the AND of both BHE and BLE. Deselect the chip by either disabling the chip enable signals or by disabling both BHE and BLE.
> 100 μs or stable at V > 100 μs.
CC(min)
CC
DR
CC(min)
Document #: 38-05440 Rev. *G
Page 4 of 13
CY62147EV30 MoBL®
Switching Characteristics
45 ns (Ind’l/Auto-A)
55 ns (Auto-E)
Unit
Parameter
Description
Min
Max
Min
Max
Read Cycle
tRC
Read Cycle Time
45
55
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tAA
Address to Data Valid
45
55
tOHA
tACE
tDOE
tLZOE
tHZOE
tLZCE
tHZCE
tPU
Data Hold from Address Change
CE LOW to Data Valid
10
10
45
22
55
25
OE LOW to Data Valid
5
10
0
5
10
0
18
18
20
20
CE LOW to Power Up
tPD
CE HIGH to Power Down
BLE/BHE LOW to Data Valid
BLE/BHE LOW to Low Z[14]
45
45
55
55
tDBE
tLZBE
tHZBE
Write Cycle[16]
tWC
10
10
18
20
Write Cycle Time
45
35
35
0
55
40
40
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tSCE
tAW
CE LOW to Write End
Address Setup to Write End
Address Hold from Write End
Address Setup to Write Start
WE Pulse Width
tHA
tSA
0
0
tPWE
tBW
35
35
25
0
40
40
25
0
BLE/BHE LOW to Write End
Data Setup to Write End
Data Hold from Write End
WE HIGH to Low-Z[14]
tSD
tHD
tHZWE
tLZWE
18
20
10
10
Notes
12. Test conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns (1V/ns) or less, timing reference levels of V
/2, input pulse
CC(typ)
levels of 0 to V
CC(typ)
OL OH
13. AC timing parameters are subject to byte enable signals (BHE or BLE) not switching when chip is disabled. See application note AN13842 for further clarification.
14. At any temperature and voltage condition, t is less than t , t is less than t , t is less than t , and t is less than t for any device.
HZCE
LZCE HZBE
LZBE HZOE
LZOE
HZWE
LZWE
15. t
, t
, t
, and t
transitions are measured when the outputs enter a high impedance state.
HZOE HZCE HZBE
HZWE
16. The internal write time of the memory is defined by the overlap of WE, CE = V , BHE, BLE, or both = V . All signals must be active to initiate a write and any of these
IL
IL
signals can terminate a write by going inactive. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write.
Document #: 38-05440 Rev. *G
Page 5 of 13
CY62147EV30 MoBL®
Switching Waveforms
tRC
ADDRESS
tAA
tOHA
PREVIOUS DATA VALID
DATA VALID
DATA OUT
ADDRESS
CE
t
RC
t
PD
HZCE
t
t
ACE
OE
t
HZOE
t
DOE
t
LZOE
BHE/BLE
t
HZBE
t
DBE
t
LZBE
HIGH
IMPEDANCE
HIGHIMPEDANCE
DATA VALID
DATA OUT
t
LZCE
t
PU
V
50%
50%
CC
I
SUPPLY
SB
CURRENT
Notes
17. The device is continuously selected. OE, CE = V , BHE, BLE, or both = V
.
IL
IL
18. WE is HIGH for read cycle.
19. Address valid before or similar to CE and BHE, BLE transition LOW.
Document #: 38-05440 Rev. *G
Page 6 of 13
CY62147EV30 MoBL®
Switching Waveforms (continued)
t
WC
ADDRESS
CE
tSCE
t
t
HA
AW
t
SA
t
PWE
WE
t
BW
BHE/BLE
OE
t
HD
t
SD
NOTE 22
DATAIN
DATA IO
t
HZOE
t
WC
ADDRESS
CE
t
SCE
tSA
t
t
HA
AW
tPWE
WE
t
BW
BHE/BLE
OE
t
t
SD
HD
DATAIN
DATA IO
t
HZOE
Document #: 38-05440 Rev. *G
Page 7 of 13
CY62147EV30 MoBL®
Switching Waveforms (continued)
t
WC
ADDRESS
CE
t
SCE
t
BW
BHE/BLE
t
t
HA
AW
t
SA
t
PWE
WE
t
HD
t
SD
DATA IO
DATAIN
t
LZWE
t
HZWE
t
WC
ADDRESS
CE
t
SCE
t
t
HA
AW
tBW
BHE/BLE
WE
t
SA
tPWE
tHZWE
t
HD
t
SD
NOTE 22
DATAIN
DATA IO
tLZWE
Notes
20. Data I/O is high impedance if OE = V
.
IH
21. If CE goes HIGH simultaneously with WE = V , the output remains in a high impedance state.
IH
22. During this period, the IOs are in output state. Do not apply input signals.
Document #: 38-05440 Rev. *G
Page 8 of 13
CY62147EV30 MoBL®
Truth Table
CE[ ]
WE
X
OE
X
BHE
X
BLE
X
IOs
Mode
Deselect/Power Down
Deselect/Power Down
Read
Power
H
L
L
L
High Z
High Z
Standby (ISB
Standby (ISB
)
)
X
X
H
H
H
L
L
L
Data Out (IO0–IO15
)
Active (ICC
Active (ICC
)
)
H
L
H
L
Data Out (IO0–IO7);
IO8–IO15 in High Z
Read
L
H
L
L
H
Data Out (IO8–IO15);
IO0–IO7 in High Z
Read
Active (ICC
)
L
L
L
L
L
H
H
H
L
H
H
H
X
X
L
H
L
L
L
H
L
L
High Z
High Z
High Z
Output Disabled
Output Disabled
Output Disabled
Write
Active (ICC
Active (ICC
Active (ICC
Active (ICC
Active (ICC
)
)
)
)
)
L
Data In (IO0–IO15)
L
H
Data In (IO0–IO7);
IO8–IO15 in High Z
Write
L
L
X
L
H
Data In (IO8–IO15);
IO0–IO7 in High Z
Write
Active (ICC
)
Ordering Information
Speed
Package
Diagram
Operating
Range
Ordering Code
(ns)
Package Type
45
CY62147EV30LL-45BVI
CY62147EV30LL-45BVXI
CY62147EV30LL-45B2XI
CY62147EV30LL-45ZSXI
CY62147EV30LL-45BVXA
CY62147EV30LL-45ZSXA
CY62147EV30LL-55ZSXE
Industrial
51-85087 44-Pin Thin Small Outline Package II (Pb-Free)
51-85087 44-Pin Thin Small Outline Package II (Pb-Free)
51-85087 44-Pin Thin Small Outline Package II (Pb-Free)
Automotive-A
Automotive-E
55
Contact your local Cypress sales representative for availability of these parts.
Notes
23. This BGA package is offered with single chip enable.
24. This BGA package is offered with dual chip enable.
Document #: 38-05440 Rev. *G
Page 9 of 13
CY62147EV30 MoBL®
Package Diagrams
Figure 12. 48-Ball VFBGA (6 x 8 x 1 mm), 51-85150
BOTTOM VIEW
A1 CORNER
TOP VIEW
Ø0.05 M C
Ø0.25 M C A B
Ø0.30 0.05(48X)
A1 CORNER
1
2
3
4
5
6
6
5
4
3
2
1
A
A
B
C
D
B
C
D
E
E
F
F
G
G
H
H
1.875
A
A
0.75
B
6.00 0.10
3.75
B
6.00 0.10
0.15(4X)
SEATING PLANE
C
51-85150-*D
Document #: 38-05440 Rev. *G
Page 10 of 13
CY62147EV30 MoBL®
Package Diagrams (continued)
Figure 13. 44-Pin TSOP II, 51-85087
51-85087-*A
Document #: 38-05440 Rev. *G
Page 11 of 13
CY62147EV30 MoBL®
Document History Page
Document Title: CY62147EV30 MoBL® 4-Mbit (256K x 16) Static RAM
Document Number: 38-05440
Orig. of
Change
Submission
Date
Rev.
ECN No.
Description of Change
**
201861
247009
AJU
SYT
01/13/04
See ECN
New Data Sheet
*A
Changed from Advanced Information to Preliminary
Moved Product Portfolio to Page 2
Changed Vcc stabilization time in footnote #8 from 100 μs to 200 μs
Removed Footnote #15(tLZBE) from Previous Revision
Changed ICCDR from 2.0 μA to 2.5 μA
Changed typo in Data Retention Characteristics(tR) from 100 μs to tRC ns
Changed tOHA from 6 ns to 10 ns for both 35 ns and 45 ns Speed Bin
Changed tHZOE, tHZBE, tHZWE from 12 to 15 ns for 35 ns Speed Bin and 15 to
18 ns for 45 ns Speed Bin
Changed tSCE and tBW from 25 to 30 ns for 35 ns Speed Bin and 40 to 35 ns
for 45 ns Speed Bin
Changed tHZCE from 12 to 18 ns for 35 ns Speed Bin and 15 to 22 ns for 45 ns
Speed Bin
Changed tSD from 15 to 18 ns for 35 ns Speed Bin and 20 to 22 ns for
45 ns Speed Bin
Changed tDOE from 15 to 18 ns for 35 ns Speed Bin
Changed Ordering Information to include Pb-Free Packages
*B
414807
ZSD
See ECN
Changed from Preliminary information to Final
Changed the address of Cypress Semiconductor Corporation on Page #1 from
“3901 North First Street” to “198 Champion Court”
Removed 35ns Speed Bin
Removed “L” version of CY62147EV30
Changed ball E3 from DNU to NC.
Removed redundant foot note on DNU.
Changed ICC (Max) value from 2 mA to 2.5 mA and ICC (Typ) value from
1.5 mA to 2 mA at f=1 MHz
Changed ICC (Typ) value from 12 mA to 15 mA at f = fmax
Changed ISB1 and ISB2 Typ values from 0.7 μA to 1 μA and Max values from
2.5 μA to 7 μA.
Changed ICCDR from 2.5 μA to 7 μA.
Added ICCDR typical value.
Changed AC test load capacitance from 50 pF to 30 pF on Page #4.
Changed tLZOE from 3 ns to 5 ns
Changed tLZCE, tLZBE and tLZWE from 6 ns to 10 ns
Changed tHZCE from 22 ns to 18 ns
Changed tPWE from 30 ns to 35 ns.
Changed tSD from 22 ns to 25 ns.
Updated the package diagram 48-pin VFBGA from *B to *D
Updated the ordering information tableandreplacedthePackageNamecolumn
with Package Diagram.
*C
*D
464503
925501
NXR
VKN
See ECN
See ECN
Included Automotive Range in product offering
Updated the Ordering Information
Added Preliminary Automotive-A information
Added footnote #9 related to ISB2 and ICCDR
Added footnote #14 related AC timing parameters
*E
*F
*G
1045701
VKN
See ECN
10/03/08
04/01/09
Converted Automotive-A and Automotive -E specs from preliminary to final
Added -45B2XI part (Dual CE option)
2577505 VKN/PYRS
2681901 VKN/PYRS
Added CY62147EV30LL-45ZSXA in the ordering information table
Document #: 38-05440 Rev. *G
Page 12 of 13
CY62147EV30 MoBL®
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at cypress.com/sales.
Products
PSoC
PSoC Solutions
General
Clocks & Buffers
Wireless
Low Power/Low Voltage
Precision Analog
LCD Drive
Memories
Image Sensors
CAN 2.0b
USB
© Cypress Semiconductor Corporation, 2007-2009. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document #: 38-05440 Rev. *G
Revised March 31, 2009
Page 13 of 13
MoBL is a registered trademark, and More Battery Life is a trademark of Cypress Semiconductor. All product and company names mentioned in this document are the
trademarks of their respective holders.
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